CHEMICAL COMPOSITION ANALYSIS OF SI ANODE WITH WDXRF

Introduction

Non-destructive and precise elemental analysis from main components to trace impurities down to ppm-level. Standardless FP analysis method enables simple and quick quantification excluding calibration curves. Trace Al and Fe in Si-based anode can be clearly detected using WDXRF with Rigaku's ZSX Primus IV spectrometer. Carbon amount can be estimated for C-coated SiO anode.

Standardless FP analysis method enables simple and quick quantification of the elements from main components to trace impurities down to 10 ppm.

WDXRF spectra of Si and SiC anode materials

Carbon is detectable. Al impurities in Si-based anode samples can be analyzed using wavelength dispersive XRF (WDXRF). Achievement of this application is difficult with energy dispersive XRF (EDXRF).