CHEMICAL COMPOSITION ANALYSIS OF SI ANODE WITH WDXRF

Introduction

Non-destructive and precise elemental analysis from main components to trace impurities down to ppm-level. Standardless FP analysis method enables simple and quick quantification excluding calibration curves. Trace Al and Fe in Si-based anode can be clearly detected using WDXRF with Rigaku's ZSX Primus IV spectrometer. Carbon amount can be estimated for C-coated SiO anode.

Standardless FP analysis method enables simple and quick quantification of the elements from main components to trace impurities down to 10 ppm.

Sample: SiO anode (ppm)

 

Al

Fe

Zr

XRF

(39)

(80)

174

ICP

11

14

129

 

Sample: C-coated SiO anode (ppm)

(ppm)

Al

Fe

Zr

XRF

(40)

134

146

ICP

16

23

175

Sample: C-coated SiO anode (mass%)

(mass%)

C

XRF

2.1

BET

1.6

Standardless FP analysis results for SiO anode material samples: the amount of carbon coating and trace impurities. The ICP analysis or BET analysis values are shown.

WDXRF spectra of Si and SiC anode materials

si anode analysis2

Carbon is detectable. Al impurities in Si-based anode samples can be analyzed using wavelength dispersive XRF (WDXRF). Achievement of this application is difficult with energy dispersive XRF (EDXRF).

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