MEASURE ALMOST ANY ELEMENT IN ALMOST ANY MATRIX
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Indispensable to both R&D and quality assurance (QA) functions, our advanced and unique Wavelength Dispersive X-ray Fluorescence (WDXRF) products are routinely used to analyze products from cement to plastics and from metals to food. Not only found in traditional manufacturing industries, but XRF is also a key elemental analysis technique for high-tech semiconductor devices and battery research.
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Rigaku offerings range from high power, high-performance wavelength dispersive WDXRF systems, for the most demanding applications, to a complete line of benchtop energy dispersive EDXRF and WDXRF systems.
X-RAY FLUORESCENCE (XRF)
What is X-ray Fluorescence? X-ray fluorescence (XRF) provides one of the simplest, most accurate, and most economical analytical methods for the determination of the elemental composition of many types of materials. Indispensable to both R&D and quality assurance (QA) functions, our advanced and unique WDXRF products are routinely used in traditional manufacturing industries (e.g. cement, plastics, metal, food) and in high-tech materials development (e.g. silicon devices and batteries). Rigaku offerings range from high power, high-performance wavelength dispersive WDXRF systems, for the most demanding applications, to a complete line of benchtop energy dispersive EDXRF and WDXRF systems.
Si-ANODE RAW MATERIAL: The source of pure Si for anode material in lithium-ion batteries is often obtained from semiconductor waste. However, the impurities from this material need to be limited and well-characterized as they may significantly affect performance.
Fe and C intensity comparison between two anodes.
IMPURITIY CONTENT OF Si-ANODE: Impurities such as Al, Ca, Fe, and Zr are easily detected at the ppm concentration levels using semi-quant analyses. To optimize electrical conductivity, the Si-anode material is coated with carbon. XRF can be used to analyze for the carbon content which is comparable to BET (surface area) methods.
PARTICLE SIZE: The key to accuracy is the reduction of the particle size for MnO and NiO powders. Homogenous sampling ensures accurate and repeatable results.
CALIBRATION CURVES: Linear range of graphite containing both MnO and NiO shows good correlation > 0.9999. Direct elemental analysis by XRF can give extremely accurate and precise results without the need to digest samples as required by ICP.
SPECTRAL SCANS: Scans of graphite containing NiO demonstrates good sensitivity with samples as small as 50mg.
THIN-FILM MODEL: Calibrations are made using various coating weights as well as core alloy compositions through the use of the Thin Film model in Rigaku’s ZSX Guidance software.
